芯片测试环节质量重入随机系统建模与性能分析
李娜, 江志斌, 郑力, 李杰
Modelling and analysis of semiconductor test system with quality re-entrance and stochastic characteristic
LI Na, JIANG Zhi-bin, ZHENG Li, LI Jie
系统工程理论与实践
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2011, (8): 1593
-1599
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DOI: 10.12011/1000-6788(2011)8-1593
