Guided topic model based product defect information detection method and applications

SHI Wen, MAO Xinglu

Systems Engineering - Theory & Practice ›› 2025, Vol. 45 ›› Issue (1) : 290-309.

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中国科学院数学与系统科学研究院期刊网
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Systems Engineering - Theory & Practice ›› 2025, Vol. 45 ›› Issue (1) : 290-309. DOI: 10.12011/SETP2023-0855

Guided topic model based product defect information detection method and applications

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{{article.zuoZheEn_L}}. {{article.title_en}}. Systems Engineering - Theory & Practice, 2025, 45(1): 290-309 https://doi.org/10.12011/SETP2023-0855

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