A high-frequency volatility model with signed jumps variation based on external information impact

GONG Yizhou, HUANG Ran

Systems Engineering - Theory & Practice ›› 2019, Vol. 39 ›› Issue (9) : 2189-2202.

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Systems Engineering - Theory & Practice ›› 2019, Vol. 39 ›› Issue (9) : 2189-2202. DOI: 10.12011/1000-6788-2018-1546-14

A high-frequency volatility model with signed jumps variation based on external information impact

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