One-sample prediction for the failure number of lognormal distribution in the future time interval

SUN Yong-quan, GUO Jian-ying, WANG Kai, CHEN Hong-ke

Systems Engineering - Theory & Practice ›› 2013, Vol. 33 ›› Issue (3) : 785-790.

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中国科学院数学与系统科学研究院期刊网
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Systems Engineering - Theory & Practice ›› 2013, Vol. 33 ›› Issue (3) : 785-790. DOI: 10.12011/1000-6788(2013)3-785

One-sample prediction for the failure number of lognormal distribution in the future time interval

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{{article.zuoZheEn_L}}. {{article.title_en}}. Systems Engineering - Theory & Practice, 2013, 33(3): 785-790 https://doi.org/10.12011/1000-6788(2013)3-785

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