Statistical process control method based on T-K control chart in multi-variety manufacturing environments

GU Kai, JIA Xin-zhang, YOU Hai-long, ZHANG Shi-hong

Systems Engineering - Theory & Practice ›› 2013, Vol. 33 ›› Issue (10) : 2639-2644.

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Systems Engineering - Theory & Practice ›› 2013, Vol. 33 ›› Issue (10) : 2639-2644. DOI: 10.12011/1000-6788(2013)10-2639

Statistical process control method based on T-K control chart in multi-variety manufacturing environments

  • GU Kai, JIA Xin-zhang, YOU Hai-long, ZHANG Shi-hong
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Abstract

According to the basic principle of SPC, it is not proper to conduct quality control using traditional statistical process control technology in multi-variety manufacturing environments. In this paper, a novel process control method is proposed. By this technology the process running state can be evaluated to monitor either characteristics mean or standard deviation by only one chart respectively. The definition and calculation method for T and K statistics and control limits for T-K control chart are suggested and explained in detail. After theoretical analysis, it is shown that T-K chart has characteristic of self-starting and stable capability for monitoring process. The application example and simulation results indicate that the proposed T-K chart can detect abnormal cause immediately and effectively in multi-variety manufacturing system, and remind the operators to react to keep the process in-control and ensure the product quality.

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multi-variety manufacturing / statistical process control / quality control / control chart

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GU Kai , JIA Xin-zhang , YOU Hai-long , ZHANG Shi-hong. Statistical process control method based on T-K control chart in multi-variety manufacturing environments. Systems Engineering - Theory & Practice, 2013, 33(10): 2639-2644 https://doi.org/10.12011/1000-6788(2013)10-2639

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