Modelling and analysis of semiconductor test system with quality re-entrance and stochastic characteristic

LI Na, JIANG Zhi-bin, ZHENG Li, LI Jie

Systems Engineering - Theory & Practice ›› 2011, Vol. 31 ›› Issue (8) : 1593-1599.

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中国科学院数学与系统科学研究院期刊网
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Systems Engineering - Theory & Practice ›› 2011, Vol. 31 ›› Issue (8) : 1593-1599. DOI: 10.12011/1000-6788(2011)8-1593

Modelling and analysis of semiconductor test system with quality re-entrance and stochastic characteristic

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{{article.zuoZheEn_L}}. {{article.title_en}}. Systems Engineering - Theory & Practice, 2011, 31(8): 1593-1599 https://doi.org/10.12011/1000-6788(2011)8-1593

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