对数正态分布下未来区间内故障次数的单样预测
孙永全, 郭建英, 王凯, 陈洪科
One-sample prediction for the failure number of lognormal distribution in the future time interval
SUN Yong-quan, GUO Jian-ying, WANG Kai, CHEN Hong-ke
系统工程理论与实践
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2013, (3): 785
-790
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DOI: 10.12011/1000-6788(2013)3-785
