基于成败型数据及分组数据指数寿命型元件失效率经典精确最优置信限

范大茵

系统工程理论与实践 ›› 1996, Vol. 16 ›› Issue (3) : 57-61.

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PDF(362 KB)
系统工程理论与实践 ›› 1996, Vol. 16 ›› Issue (3) : 57-61. DOI: 10.12011/1000-6788(1996)3-57
论文

基于成败型数据及分组数据指数寿命型元件失效率经典精确最优置信限

    范大茵
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The Classical Exact Optimal Upper Confidence Limit of Failuer Rate for Exponential-Span Type Component Based the Group Data and Binomial Data

    Fan Dayin
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摘要

设A是一个指数寿命型元件,设其寿命服从参数为λ的指数分布,λ>0,λ未知.本文研究基于该元件的一次性检测数据及分组数据,用样本点排序法计算元件失效率λ的经典精确最优置信上限,并证明了所得置信上限的最优性.

Abstract

Let A be an exponential-span type component and the span satisfy exponential distribution Eλ, here parameter λ is unknown.In this paper, we obtain the classical exact optimal upper confidence limits of failure rate λ using the ordering method of sample points based on the group data and binomial data. Morever we proye the optimality of our results.

关键词

指数分布 / 经典精确最优置信限

Key words

exponential distribution / classical exact optimal confidence limit

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导出引用
范大茵. 基于成败型数据及分组数据指数寿命型元件失效率经典精确最优置信限. 系统工程理论与实践, 1996, 16(3): 57-61 https://doi.org/10.12011/1000-6788(1996)3-57
Fan Dayin. The Classical Exact Optimal Upper Confidence Limit of Failuer Rate for Exponential-Span Type Component Based the Group Data and Binomial Data. Systems Engineering - Theory & Practice, 1996, 16(3): 57-61 https://doi.org/10.12011/1000-6788(1996)3-57
中图分类号: TB114   
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